The La Pierre Group
SINGLE CRYSTAL X-RAY DIFFRACTOMETER
The single crystal X-ray diffractometer in the La Pierre group provides quality diffraction data for the structure analysis of compounds. Our state-of-the-art equipment includes a Bruker D8 Venture with HELIOS Cu and Mo μS sources and a PHOTON II CPAD detector.
Our facility personnel can help you with your single crystal diffraction needs. Single crystal X-ray analyses include a publishable quality CIF and a complete structural report. We provide a detailed analysis of the results and supply you with a complete report of your structure as well as any relevant information that is needed for publication. We also have the capability of providing analyses for uranium- and thorium-containing crystals, including waste disposal.
Rates for Georgia Tech Affiliated Academic Users
Full structure analysis: data collection, data reduction, and standard structure determination
Personnel assistance
Instrument time
"What is this?"
Unit cell determination
$300
$75/hour
$25/hour
1 hour personnel assistance
1 hour personnel assistance
CRYSTALLOGRAPHY LAB PERSONNEL
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Kaitlyn Otte
Matilda Duffy
Dr. Julie Niklas
Florian Reßnik
Facility Manager
la_pierre@chemistry.gatech.edu
Facility Director
Please contact Kaitlyn Otte for all inquiries for your crystallographic needs. For uranium- and thorium-containing compounds, please contact Prof. La Pierre.
CRYSTALLOGRAPHY LAB PUBLICATIONS
Publications are listed for articles not already included on the La Pierre Group Publications page.
The crystallographers are in bold.