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SINGLE CRYSTAL X-RAY DIFFRACTOMETER

The single crystal X-ray diffractometer in the La Pierre group provides quality diffraction data for the structure analysis of compounds. Our state-of-the-art equipment includes a Bruker D8 Venture with HELIOS Cu and Mo μS sources and a PHOTON II CPAD detector.

Our facility personnel can help you with your single crystal diffraction needs. Single crystal X-ray analyses include a publishable quality CIF and a complete structural report. We provide a detailed analysis of the results and supply you with a complete report of your structure as well as any relevant information that is needed for publication. We also have the capability of providing analyses for uranium- and thorium-containing crystals, including waste disposal. 

Rates for Georgia Tech Affiliated Academic Users

Full structure analysis: data collection, data reduction, and standard structure determination

Personnel assistance

Instrument time

"What is this?"

Unit cell determination

$300

$75/hour

$25/hour

1 hour personnel assistance

1 hour personnel assistance

CRYSTALLOGRAPHY LAB PERSONNEL

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Kaitlyn Otte

Matilda Duffy

Dr. Julie Niklas

Florian Reßnik

kotte3@gatech.edu

Facility Manager

Please contact Kaitlyn Otte for all inquiries for your crystallographic needs. For uranium- and thorium-containing compounds, please contact Prof. La Pierre.

CRYSTALLOGRAPHY LAB PUBLICATIONS

Publications are listed for articles not already included on the La Pierre Group Publications page.

The crystallographers are in bold.

© 2016-2018 by The Trustees of Georgia Institute of Technology

Georgia Institute of Technology - School of Chemistry and Biochemistry

Molecular Science and Engineering - 901 Atlantic Dr NW, Atlanta, GA 30322

Henry S. La Pierre

la_pierre@chemistry.gatech.edu

Office: (404) 385-3258

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